Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip

• compared to conventional techniques. Keywords: atomic force microscopy; fast Fourier transform; mechanical properties; system theory; white noise; Introduction There are several methods to measure mechanical properties at the nanoscale level, based on, e.g., nanoindentation or on other physical phenomena

• instrumentation requirements and higher frequency resolution at different resonant modes. Also, more than one vibrational mode in each measurement step as well as indentation modulus mappings are obtained. This is possible when system theory [21] is taken into account, i.e., the system identification problem [22

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

• César Moreno,
• Carmen Munuera,
• Xavier Obradors and
• Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

• are involved, as already observed in other thin-oxide-based memristor systems [4]. The fundamental memristive system theory states that the observation of a pinched current-versus-voltage hysteresis loop measured from an experimental two-terminal device, when driven by a dc and/or sinusoidal signal of